The Atomic Force Microscope Market is driven by technological advancement
The atomic force microscope (AFM) is a type of scanning probe microscope with demonstrated resolution on the order of fractions of a nanometer, which is more than 1000 times better than the optical diffraction limit. It uses a microscale cantilever with a sharp tip to measure local properties such as height, friction, magnetism, etc. The AFM provides 3D profiles of surfaces with nanoscale resolution by measuring forces between a sharp probe (less than 10 nm) and sample surface at very short distance.
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